Loading ...

Ag-Al2O3-Ag nanodisks array on fused SiO2

Based on

1 Articles
2017 Most recent source

Composition

Image only illustrates the order and placement of components as described in literature.

1

silver

Type Single Compound
Formula Ag
Role layer
2

aluminium oxide

aluminum oxide alumina
Type Single Compound
Formula Al2O3
Role layer
3

silver

Type Single Compound
Formula Ag
Role layer

Applications

Area Application Nanomaterial Variant Source
data storage

More information available to subscribers only.

Or, view sample content

Characterization

Method Nanomaterial Variant Source
scanning electron microscopy

More information/entries available to subscribers only.

Or, view sample content

Preparation

Method 1

Type: Physical formation
Source:
Starting materials
  • SiOx substrates
  • silver
  1. qFsZSXTZLWWhuH8Ro0VFYf3LJGBmn
Product

Ag-Al2O3-Ag nanodisks array on fused SiO2

Periodicity: 410 nm

Radius: 95 nm

Thickness: 20 nm

Thickness: 30 nm

Medium: none

Support: SiOx substrates

Method 2

Type: Physical formation
Source:
Starting materials
  • SiOx substrates
  • silver
  1. ImRERZaY0wStWsyxGAqVe7tsC9fWB
Product

Ag-Al2O3-Ag nanodisks array on fused SiO2

Periodicity: 450 nm

Radius: 110 nm

Thickness: 20 nm

Thickness: 30 nm

Medium: none

Support: SiOx substrates

Method 3

Type: Physical formation
Source:
Starting materials
  • SiOx substrates
  • silver
  1. TRWe9nFKRvUtMXCcN3C0xUygNvsmx
Product

Ag-Al2O3-Ag nanodisks array on fused SiO2

Periodicity: 380 nm

Radius: 80 nm

Thickness: 10 nm

Thickness: 30 nm

Medium: none

Support: SiOx substrates

Method 4

Type: Physical formation
Source:
Starting materials
  • SiOx substrates
  • silver
  1. VapqrW3chcrLMmdp3mox5t1TgbTeZ
Product

Ag-Al2O3-Ag nanodisks array on fused SiO2

Periodicity: 380 nm

Radius: 80 nm

Thickness: 30 nm

Medium: none

Support: SiOx substrates

Method 5

Type: Physical formation
Source:
Starting materials
  • SiOx substrates
  • silver
  1. vfiAzpfU6xCohrfNIoegb3hiLgIMT
Product

Ag-Al2O3-Ag nanodisks array on fused SiO2

Periodicity: 380 nm

Radius: 80 nm

Thickness: 20 nm

Thickness: 25 nm

Medium: none

Support: SiOx substrates

References

Full content is available to subscribers only

To view content please choose from the following:


Sign up for a free trial