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patterned poly(styrene-r-2-vinylpyridine-r-hydroxyethyl methacrylate)/patterned crosslinked polystyrene film/silicon

Based on

1 Articles
2016 Most recent source

Composition

Image only illustrates the order and placement of components as described in literature.

1

silicon

Type Single Compound
Formula Si
Role layer
2

crosslinked polystyrene

XPS
Type Polymer
Formula
Role partial layer
3

poly(styrene-rand-2-vinylpyridine-rand-hydroxyethyl methacrylate) random copolymer

poly(styrene-r-2-vinylpyridine-r-hydroxyethyl methacrylate) P(S-r-2VP-r-HEMA) random copolymer P(S-r-2VP-r-HEMA) brush P(S-r-2VP-r-HEMA)
Type Polymer
Formula
Role partial layer

Preparation

Method 1

Type: Chemical synthesis
Source:
  1. S6YcovJKVOIkaCsvJklUHp
  2. hp7JBiQjYU4zu0X6d2Csxu5yp
Product

patterned poly(styrene-r-2-vinylpyridine-r-hydroxyethyl methacrylate)/patterned crosslinked polystyrene film/silicon

Line width: 24 nm

Periodicity: 64 nm

Thickness: 6 - 8 nm

Medium/Support: none

Method 2

Type: Chemical synthesis
Source:
  1. ALPvvUxXXSJYiWr8Vf8r8q
  2. COkpQGJyBliuibHGKKSrIHvQA
Product

patterned poly(styrene-r-2-vinylpyridine-r-hydroxyethyl methacrylate)/patterned crosslinked polystyrene film/silicon

Line width: 19.1 nm

Periodicity: 65 nm

Thickness: 6 - 8 nm

Medium/Support: none

Method 3

Type: Chemical synthesis
Source:
  1. AWNAScNw8jMjkNbAlxvyc4
  2. aI1nlzUlxwwsnfAzU0T1Y6BzP
Product

patterned poly(styrene-r-2-vinylpyridine-r-hydroxyethyl methacrylate)/patterned crosslinked polystyrene film/silicon

Line width: 24.75 nm

Periodicity: 66 nm

Thickness: 6 - 8 nm

Medium/Support: none

Method 4

Type: Chemical synthesis
Source:
  1. NAvgKoAYhzS9PVncD6I28J
  2. wsoS0sP4QQpBgThHX3f5Bh1nu
Product

patterned poly(styrene-r-2-vinylpyridine-r-hydroxyethyl methacrylate)/patterned crosslinked polystyrene film/silicon

Line width: 24.6 nm

Periodicity: 49 nm

Thickness: 6 - 8 nm

Medium/Support: none

Method 5

Type: Chemical synthesis
Source:
  1. Wvre0in76sxzSnxiD86zGb
  2. npJiG1UpNMGcpWDepFucOKU5b
Product

patterned poly(styrene-r-2-vinylpyridine-r-hydroxyethyl methacrylate)/patterned crosslinked polystyrene film/silicon

Line width: 15.0 nm

Periodicity: 65 nm

Thickness: 6 - 8 nm

Medium/Support: none

References

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