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trifluoromethanesulfonate-stabilized poly(3,4-ethylenedioxythiophene) thin film

Based on

2 Articles
2016 Most recent source

Composition

Image only illustrates the order and placement of components as described in literature.

1

PEDOT:PSS

Type Complex Compound
Formula
Role raw materials

Properties

General physical and chemical properties

Property Value Nanomaterial Variant Source
disordered metal conductivity of amorphous region

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Applications

Area Application Nanomaterial Variant Source
electrodes/electrolytes

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Characterization

Method Nanomaterial Variant Source
atomic force microscopy

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Preparation

Method 1

Type: Chemical synthesis
Source:
Starting materials
  • iron(III) trifluoromethanesulfonate
  1. iwGKFPEKDRdDNSSjp3IaAtDYSYkszmkE9k
  2. znjIQe1CST8EUYla2gdizApJxs3EKSpEXyNn3PVrcY0KLdP76VwRHcakLVoGfyZxCJOzJHn4AgaD5bmdxGz6AAYRROErS1AjAPnibXNHPde5lOtDrDqsavCN82K
Product

trifluoromethanesulfonate-stabilized poly(3,4-ethylenedioxythiophene) thin film

Thickness: ~ 35 nm

Medium/Support: none

Method 2

Type: Chemical synthesis
Source:
Starting materials
  • iron(III) trifluoromethanesulfonate
  1. bbVgXkszqQnfNEkwJ8f1ANQMduSrCiaMD4
  2. hhtK0wv261n1i2vntUXikkrnJL9epWB4qViW6MNBtt9TvmsjUIL2OL6eznSa5P3P8h6AV1j5y41o17eHk7BBxNMjX7ihbxEykhmSZph0xaYY37aX2icIkVljREq
Product

trifluoromethanesulfonate-stabilized poly(3,4-ethylenedioxythiophene) thin film

Thickness: ~ 35 nm

Medium/Support: none

Method 3

Type: Chemical synthesis
Source:
Starting materials
  • iron(III) trifluoromethanesulfonate
  1. YbC4MsXjp0cEijVAFhhRKF10Eyo7sHVfzfZysGQ
  2. 29Di9cZqtA9TdCt8wV3GweuUGpCs2OgDKhOC2u3QCVqDyFWq6GVpCzzowRwvkjUyA0u8kLuF3DBWsLPs7kFvjBC26FYjytaO735K1tJEXN6wzRxxHdee575rNzW
Product

trifluoromethanesulfonate-stabilized poly(3,4-ethylenedioxythiophene) thin film

Thickness: ~ 35 nm

Medium/Support: none

Method 4

Type: Chemical synthesis
Source:
Starting materials
  • iron(III) trifluoromethanesulfonate
  1. UQcOCq715Z8Uo3QFdVhCXZyfDFB3l0te8s
  2. MyXimlVaWXuebBBmjx5k4h6jiRpSfPUHsIOcpakfNPk2Mc0dd9IDzpme7fAsWW2TYrd9OczwnVp2A1z5xouKhZd0BCESoXYnUDV1ZZ2kFJyKBVjWaHCZE9z0Mny
Product

trifluoromethanesulfonate-stabilized poly(3,4-ethylenedioxythiophene) thin film

Thickness: ~ 60 nm

Medium/Support: none

Method 5

Type: Chemical synthesis
Source:
Starting materials
  • iron(III) trifluoromethanesulfonate
  1. 1fY9J5lgzXi1euKVh9VuPewHf6yxWPazjbw4xag
  2. PpSHPm8HRsJsKfGFwDC5JpUW1TfZ6CrElsJeIdFonTbV7GDKRlcUjKvFzPrIYgNlUmlIwCWFwkoFTXUjgVmRRLcp8y1h9cRKHM9OaJlhEgpxnq24Wi40bKqgix1
Product

trifluoromethanesulfonate-stabilized poly(3,4-ethylenedioxythiophene) thin film

In-plane crystallite size: 4.50 - 5.50 nm

Out-of-plane crystallite size: 8 - 10 nm

Thickness: ~ 10 nm

Medium/Support: none

References

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