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poly(3,4-ethylenedioxythiophene) film

Based on

1 Articles
2015 Most recent source

Composition

1

poly(3,4-ethylenedioxythiophene)

PEDOT
Type Polymer
Formula
Role raw materials
2

iron(II) hydroxide

Type Single Compound
Formula Fe(OH)2
Role dopant
3

iron oxyhydroxide

Type Single Compound
Formula FeOOH
Role dopant

Properties

General physical and chemical properties

Property Value Nanomaterial Variant Source
electrical conductivity

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Applications

Area Application Nanomaterial Variant Source
optoelectronics

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Characterization

Method Nanomaterial Variant Source
atomic force microscopy

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Preparation

Method 1

Type: Chemical synthesis
Source:
Starting materials
  • iron(III) chloride
  • 3,4-ethylenedioxylthiophene
  • water
See all (4)
  1. 0sWpFkrj1lWulnrTWruxCKugNoS
  2. Bm2AFsjQc6E65mPDROjBtyJdarsp1ozlyJ9
Product

poly(3,4-ethylenedioxythiophene) film

Thickness: ~ 60 nm

Medium/Support: none

Method 2

Type: Chemical synthesis
Source:
Starting materials
  • iron(III) chloride
  • 3,4-ethylenedioxylthiophene
  • water
See all (4)
  1. QZC5CxmJF93u64l4z20wgDaTpJ7
  2. 46U0DN4lbKhf1kRoQGho1zyTpfZJsXCKVZi
Product

poly(3,4-ethylenedioxythiophene) film

Thickness: ~ 12 nm

Medium/Support: none

Method 3

Type: Chemical synthesis
Source:
Starting materials
  • iron(III) chloride
  • water
  • 3,4-ethylenedioxylthiophene
See all (5)
  1. o4e8Vn6KMPlgB1sdeYj8QejIeWV
  2. angtUZctcHDBGwrw5dD3w1GA3YrCg0QWzfL
Product

poly(3,4-ethylenedioxythiophene) film

Thickness: 75 nm

Medium: none

Support: soda-lime-silica glass

Method 4

Type: Chemical synthesis
Source:
Starting materials
  • iron(III) chloride
  • 3,4-ethylenedioxylthiophene
  • water
See all (4)
  1. pu0PwX6PPjp9ICCuvwn8jPwgBEX
  2. cOV7QtKlM8yVfdS893uBnq4r4ftPdE4Ex3Y
Product

poly(3,4-ethylenedioxythiophene) film

Thickness: 25 nm

Medium/Support: none

Method 5

Type: Chemical synthesis
Source:
Starting materials
  • iron(III) chloride
  • 3,4-ethylenedioxylthiophene
  • water
See all (4)
  1. k6T1XTOcAgolO34MGY10TFgaEhV
  2. M3M8V35gxSokVOAuYTayvgxEwyLkyC41XtU
Product

poly(3,4-ethylenedioxythiophene) film

RMS roughness: 3.14 nm

Thickness: ~ 80 nm

Medium/Support: none

References

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