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AgNi nanomesh on polyethersulfone

Based on

1 Articles
2014 Most recent source

Composition

Image only illustrates the order and placement of components as described in literature.

1

AgNi

Type Single Compound
Formula AgNi
Role raw materials

Properties

General physical and chemical properties

Property Value Nanomaterial Variant Source
figure of merit

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Applications

Area Application Nanomaterial Variant Source
electrodes/electrolytes

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Characterization

Method Nanomaterial Variant Source
field emission scanning electron microscopy

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Preparation

Method 1

Type: Physical formation
Source:
Starting materials
  • AgNi
  1. 58fT1qtKlSdgDgl6Ervs2Q2bTzuqrY8WGLXVntzsiuHqolIFjHQGnbpULlQs53JiYeMbijfLX2pm
Product

AgNi nanomesh on polyethersulfone

Line spacing: 3200 nm

Line width: 150 nm

Thickness: 60 nm

Medium: none

Support: PES

Method 2

Type: Physical formation
Source:
Starting materials
  • AgNi
  1. p5SnVuuTMlutllOSaK2UiTs1liQL8wCIEvlcd6MS85Vdg8UdqoPWlJFUk7vCTtEI7BQAcYedutRo
Product

AgNi nanomesh on polyethersulfone

Line spacing: 1600 nm

Line width: 150 nm

Thickness: 80 nm

Medium: none

Support: PES

Method 3

Type: Physical formation
Source:
Starting materials
  • AgNi
  1. nKo0doXF3cPrKfkymmJVw67VN8ZjyGNsmk6aWxARsOI5PCKH5x5dXlqgP2O30NSo7cFsKL97DOsR
Product

AgNi nanomesh on polyethersulfone

Line spacing: 1000 nm

Line width: 150 nm

Thickness: 80 nm

Medium: none

Support: PES

Method 4

Type: Physical formation
Source:
Starting materials
  • AgNi
  1. v5dSPL3fK7sJMhPaPqH8Ww1D01h6mKF3eF4piBU2r0lSInpLEolhxWDFS4V60eDkOk3vuwon4HIV
Product

AgNi nanomesh on polyethersulfone

Line spacing: 3200 nm

Line width: 150 nm

Thickness: 100 nm

Medium: none

Support: PES

Method 5

Type: Chemical synthesis
Source:
Starting materials
  • AgNi
  1. ESMXbmRIOUfXm4a1p8P1dlZvUijUeflgH7Q1hPqQpL3ILo1AvVRnGduQ95VQr4zMAo5dCB7WHpYV
Product

AgNi nanomesh on polyethersulfone

Line spacing: 1600 nm

Line width: 150 nm

Thickness: 80 nm

Medium: none

Support: NOA 61/polyethersulfone

References

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