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Si quantum dot-loaded SiO2 film

Based on

1 Articles
2015 Most recent source

Composition

Image only illustrates the order and placement of components as described in literature.

1

silicon dioxide

silicic oxide silica
Type Single Compound
Formula SiO2
Role layer
2

silicon

Type Single Compound
Formula Si
Role loaded material

Properties

General physical and chemical properties

Property Value Nanomaterial Variant Source
electric current dependent on illuminated light wavelength

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Characterization

Method Nanomaterial Variant Source
atomic force microscopy

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Preparation

Method 1

Type: Chemical synthesis
Source:
Starting materials
  • silicon
  • oxygen
  1. BpEvwwWlBRas9qdN7JL
Product

Si quantum dot-loaded SiO2 film

Size: 3.4 nm

Thickness: ~ 100 nm

Medium/Support: none

Method 2

Type: Chemical synthesis
Source:
Starting materials
  • silicon
  • oxygen
  1. Sia85w29nJw3Q4Jidc0
Product

Si quantum dot-loaded SiO2 film

RMS roughness: ~ 0.26 nm

Size: 2.8 nm

Medium/Support: none

Method 3

Type: Chemical synthesis
Source:
Starting materials
  • silicon
  • oxygen
  1. pwGtEIke4XruafBKc4q
Product

Si quantum dot-loaded SiO2 film

Size: 1.9 nm

Thickness: ~ 100 nm

Medium/Support: none

Method 4

Type: Chemical synthesis
Source:
Starting materials
  • silicon
  • oxygen
  1. FmDW21dATU4lixK46nH
Product

Si quantum dot-loaded SiO2 film

Size: 2.5 nm

Thickness: ~ 100 nm

Medium/Support: none

Method 5

Type: Chemical synthesis
Source:
Starting materials
  • silicon
  • oxygen
  1. zQVRrvDSITgzwxmEEzU
Product

Si quantum dot-loaded SiO2 film

Size: 2.1 nm

Thickness: ~ 100 nm

Medium/Support: none

References

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