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Pt-Ni multipods-filled-DIO-loaded-PC71BM-filled-poly{[4,8-bis(2-ethyl-hexyl-thiophene-5-yl)-benzo[1,2-b:4,5-b]-dithiophene-2,6-diyl]-alt-[2-(2-ethyl-hexanoyl)-thieno[3,4-b]-thiophen-4,6-diyl]} blend film

Based on

1 Articles
2014 Most recent source

Composition

1

DIO-loaded-PC71BM-filled-poly{[4,8-bis(2-ethyl-hexyl-thiophene-5-yl)-benzo[1,2-b:4,5-b]-dithiophene-2,6-diyl]-alt-[2-(2-ethyl-hexanoyl)-thieno[3,4-b]-thiophen-4,6-diyl]} blend film

1,8-diiodooctane-loaded-PBDTT-C-T:PC71BM blend film DIO-loaded-PC71BM-filled-PBDTTT-C-T blend film
Type Nano Material
Formula
Role binder
2

platinum-nickel nanocrystals

Pt-Ni nanoparticles Pt-Ni nanocrystals Pt-Ni multipods
Type Nano Material
Formula
Role fillers

Properties

General physical and chemical properties

Property Value Nanomaterial Variant Source
electron mobility

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Applications

Area Application Nanomaterial Variant Source
power generation

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Characterization

Method Nanomaterial Variant Source
atomic force microscopy

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Preparation

Method 1

Type: Physical formation
Source:
Starting materials
  1. wvBH1HzbtI8Mo9TF2VV9cI15
  2. m8mMqvu
Product

Pt-Ni multipods-filled-DIO-loaded-PC71BM-filled-poly{[4,8-bis(2-ethyl-hexyl-thiophene-5-yl)-benzo[1,2-b:4,5-b]-dithiophene-2,6-diyl]-alt-[2-(2-ethyl-hexanoyl)-thieno[3,4-b]-thiophen-4,6-diyl]} blend film

RMS roughness: 3.58 nm

Medium/Support: none

Method 2

Type: Physical formation
Source:
Starting materials
  1. 9Vw9T0XXiJgC6GHVRrbbBAAC
  2. Epr8vbJ
Product

Pt-Ni multipods-filled-DIO-loaded-PC71BM-filled-poly{[4,8-bis(2-ethyl-hexyl-thiophene-5-yl)-benzo[1,2-b:4,5-b]-dithiophene-2,6-diyl]-alt-[2-(2-ethyl-hexanoyl)-thieno[3,4-b]-thiophen-4,6-diyl]} blend film

RMS roughness: 2.78 nm

Medium/Support: none

Method 3

Type: Physical formation
Source:
Starting materials
  1. dy2abULOWVvfX1DY6RJmMHm3
  2. 3Rbp9Sz
Product

Pt-Ni multipods-filled-DIO-loaded-PC71BM-filled-poly{[4,8-bis(2-ethyl-hexyl-thiophene-5-yl)-benzo[1,2-b:4,5-b]-dithiophene-2,6-diyl]-alt-[2-(2-ethyl-hexanoyl)-thieno[3,4-b]-thiophen-4,6-diyl]} blend film

RMS roughness: 2.52 nm

Medium/Support: none

References

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