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PS film

Based on

52 Articles
2018 Most recent source

Composition

1

polystyrene

PS
Type Polymer
Formula
Role raw materials

Properties

General physical and chemical properties

Property Value Nanomaterial Variant Source

Details in source

Details in source

amplitude-phase-distance curve

Details in source

amplitude-phase-distance curve

Details in source

Details in source

Thickness: 78 nm

Medium/Support: none

View data for this variant only

Details in source

Thickness: ~< 6.6 nm

Medium/Support: none

View data for this variant only

Details in source

Thickness: ~< 6.6 nm

Medium/Support: none

View data for this variant only

Details in source

Size: not specified

Medium/Support: none

View data for this variant only

Details in source

Thickness: 100 nm

Medium/Support: none

View data for this variant only

Details in source

Thickness: ~ 50 nm

Medium/Support: none

View data for this variant only

Details in source

Thickness: 12 - 38 nm

Medium/Support: none

View data for this variant only

Details in source

Thickness: 10 - 100 nm

Medium/Support: none

View data for this variant only

Details in source

Thickness: 10 - 100 nm

Medium/Support: none

View data for this variant only

Details in source

Thickness: 100 nm

Medium/Support: none

View data for this variant only

Details in source

film viscosity normalized to bulk viscosity

Details in source

film viscosity normalized to bulk viscosity

Details in source

film viscosity normalized to bulk viscosity

Details in source

film viscosity normalized to bulk viscosity

Details in source

film viscosity normalized to bulk viscosity

Details in source

Details in source

Thickness: 91 nm

Medium: none

Support: Si/SiO2

View data for this variant only

Details in source

Thickness: 91 nm

Medium: none

Support: Si/SiO2

View data for this variant only

Details in source

Thickness: ~ 300 nm

Medium/Support: none

View data for this variant only

No matching record found

Applications

Area Application Nanomaterial Variant Source

organic thin-film coating technologies

coatings

organic thin-film coating technologies

Thickness: 40 nm

Medium/Support: none

View data for this variant only

coatings

organic thin-film coating technologies

Thickness: 10 nm

Medium/Support: none

View data for this variant only

coatings

organic thin-film coating technologies

solid electrolytes for batteries

Thickness: ~ 40 nm

Medium/Support: none

View data for this variant only

energy storage devices

Thickness: ~ 40 nm

Medium/Support: none

View data for this variant only

membrane nanofiltration

Thickness: ~ 40 nm

Medium/Support: none

View data for this variant only

membrane nanofiltration

Thickness: ~ 40 nm

Medium/Support: none

View data for this variant only

lithography template

nanoprinting/nanolithography

lithography template

Pore diameter: 37 nm

Medium/Support: none

View data for this variant only

model system to study thickness dependent viscosity of polymer films

other

model system to study thickness dependent viscosity of polymer films

other

model system to study thickness dependent viscosity of polymer films

other

model system to study thickness dependent viscosity of polymer films

other

model system to study thickness dependent viscosity of polymer films

other

model system to study thickness dependent viscosity of polymer films

other

model system to study thickness dependent viscosity of polymer films

other

template for nanostructured calcite single crystal formation

Size: not specified

Medium/Support: none

View data for this variant only

waterproof inks

organic solar cells

Thickness: ~ 40 nm

Medium/Support: none

View data for this variant only

power generation

organic solar cells donor layer

Thickness: 100 nm

Medium/Support: none

View data for this variant only

template for gold plasmonic nanostructures fabrication

Size: not specified

Medium/Support: none

View data for this variant only

raw materials/precursors/templates

template for metal grid preparation

Thickness: 40 nm

Medium: none

Support: silicon

View data for this variant only

raw materials/precursors/templates

well-defined metal nanodots (ND) array template

raw materials/precursors/templates

nanowire template

Thickness: ~ 40 nm

Medium/Support: none

View data for this variant only

raw materials/precursors/templates

precursor for patterned surface formation for cell oriented spreading

Thickness: ~ 300 nm

Medium/Support: none

View data for this variant only

raw materials/precursors/templates

template sponge-like nanoporous silica film preparation

Thickness: 98 nm

Medium/Support: none

View data for this variant only

No matching record found

Characterization

Method Nanomaterial Variant Source

atomic force microscopy

atomic force microscopy

atomic force microscopy

atomic force microscopy

Thickness: 17.9 - 18.3 nm

Medium/Support: none

View data for this variant only

atomic force microscopy

Thickness: ~ 100 nm

Medium/Support: none

View data for this variant only

atomic force microscopy

Size: not specified

Medium/Support: none

View data for this variant only

atomic force microscopy

atomic force microscopy

atomic force microscopy

atomic force microscopy

Thickness: 4.3 nm

Medium: none

Support: silicon

View data for this variant only

atomic force microscopy

atomic force microscopy

atomic force microscopy

Thickness: 7.1 nm

Medium: none

Support: silicon

View data for this variant only

atomic force microscopy

Thickness: 16 nm

Medium/Support: none

View data for this variant only

atomic force microscopy

Thickness: 28 nm

Medium/Support: none

View data for this variant only

atomic force microscopy

Thickness: 20 nm

Medium/Support: none

View data for this variant only

atomic force microscopy

Thickness: 12 nm

Medium/Support: none

View data for this variant only

atomic force microscopy

Thickness: ~ 50 nm

Medium/Support: none

View data for this variant only

atomic force microscopy

Thickness: 8 nm

Medium/Support: none

View data for this variant only

atomic force microscopy

Thickness: 10 nm

Medium/Support: none

View data for this variant only

atomic force microscopy

Thickness: 18 nm

Medium/Support: none

View data for this variant only

atomic force microscopy

Thickness: 40 nm

Medium/Support: none

View data for this variant only

atomic force microscopy

Thickness: 14 nm

Medium/Support: none

View data for this variant only

atomic force microscopy

Thickness: 9 nm

Medium/Support: none

View data for this variant only

atomic force microscopy

atomic force microscopy

atomic force microscopy

atomic force microscopy

Thickness: 100 nm

Medium/Support: none

View data for this variant only

atomic force microscopy

atomic force microscopy

atomic force microscopy

Thickness: ~ 12 nm

Medium/Support: none

View data for this variant only

atomic force microscopy

Thickness: ~ 400 nm

Medium/Support: none

View data for this variant only

Thickness: 98 nm

Medium/Support: none

View data for this variant only

Thickness: 18 nm

Medium: none

Support: silicon

View data for this variant only

Thickness: 40 nm

Medium: none

Support: silicon

View data for this variant only

optical microscopy

optical microscopy

Thickness: 17.9 - 18.3 nm

Medium/Support: none

View data for this variant only

optical microscopy

optical microscopy

optical microscopy

optical microscopy

optical microscopy

optical microscopy

Thickness: 10 nm

Medium/Support: none

View data for this variant only

optical microscopy

optical microscopy

Thickness: 40 nm

Medium/Support: none

View data for this variant only

optical microscopy

Thickness: 100 nm

Medium/Support: none

View data for this variant only

scanning electron microscopy

scanning electron microscopy

scanning electron microscopy

scanning electron microscopy

scanning electron microscopy

Thickness: ~ 40 nm

Medium/Support: none

View data for this variant only

scanning electron microscopy

scanning electron microscopy

Thickness: ~ 50 nm

Medium/Support: none

View data for this variant only

scanning electron microscopy

Pore size: ~ 43 nm

Medium: none

Support: Si/SiO2

View data for this variant only

scanning electron microscopy

scanning electron microscopy

Size: not specified

Medium/Support: none

View data for this variant only

Thickness: 100 nm

Medium/Support: none

View data for this variant only

Thickness: ~ 40 nm

Medium/Support: none

View data for this variant only

Thickness: ~ 40 nm

Medium/Support: none

View data for this variant only

Thickness: ~ 80 nm

Medium/Support: none

View data for this variant only

No matching record found

Biological effects

Biological system Test details Nanomaterial Variant Source

poor antibacterial activity

Thickness: ~ 40 nm

Medium/Support: none

View data for this variant only

poor antibacterial activity

Thickness: ~ 40 nm

Medium/Support: none

View data for this variant only

No matching record found

Preparation

No matching record found

Method 1

Type: Physical formation
Starting materials
  • polystyrene
dissolution
1
  1. toluene
spin casting
2
  • Si/SiO2
annealing
3
  1. ambient condition
Product

PS film

Thickness: 91 nm

Medium: none

Support: Si/SiO2

View data for this variant only

Method 2

Type: Physical formation
Starting materials
  • polystyrene
dissolution
1
  1. toluene
spin casting
2
  • Si/SiO2
annealing
3
  1. chloroform vapor of 33.3 %
Product

PS film

Method 3

Starting materials
  • polystyrene
1
  1. toluene solution
filtration
2
spin coating
3
  1. glass as substrate
Product

PS film

Size: not specified

Medium/Support: none

View data for this variant only

Method 4

Type: Physical formation
Starting materials
  • polystyrene
dissolution
1
  1. toluene
spin casting
2
  • Si/SiO2
annealing
3
  1. chloroform vapor of 14.3 %
Product

PS film

Method 5

Type: Physical formation
Starting materials
  • polystyrene
dissolution
1
  1. toluene
spin casting
2
  • Si/SiO2
annealing
3
  1. ambient condition
Product

PS film

References

Journal articles

Martin Dehnert; Robert Magerle (2018)
3D depth profiling of the interaction between an AFM tip and fluid polymer solutions

Nanoscale, vol. 10, issue 12, pp 5695 - 5707

Naresh Kumar; Weitao Su; Martin Veselý; Bert M. Weckhuysen; Andrew J. Pollard; Andrew J. Wain (2018)
Nanoscale chemical imaging of solid-liquid interfaces using tip-enhanced Raman spectroscopy

Nanoscale, vol. 10, issue 4, pp 1815 - 1824

Kumar, Deepak; Paulsen, Joseph D.; Russell, Thomas P.; Menon, Narayanan (2018)
Wrapping with a splash: High-speed encapsulation with ultrathin sheets

Science (Washington, DC, U. S.), vol. 359, issue 6377, pp 775 - 778

Cao, Peigen; Bai, Peter; Omrani, Arash A.; Xiao, Yihan; Meaker, Kacey L.; Tsai, Hsin-Zon; Yan, Aiming; Jung, Han Sae; Khajeh, Ramin; Rodgers, Griffin F.; Kim, Youngkyou; Aikawa, Andrew S.; Kolaczkowski, Mattew A.; Liu, Yi; Zettl, Alex; Xu, Ke; Crommie, Michael F.; Xu, Ting (2017)
Preventing Thin Film Dewetting via Graphene Capping

Adv. Mater., vol. 29, issue 36

Kim, Kwang Su; Kim, Jong Uk; Lee, Sori; Lee, Ju Seung; Jo, Young Jin; Park, Byeonghak; Tak, Hyowon; Yoo, Pil J.; Kim, Tae-Il (2017)
High-Precision Temperature-Controllable Metal-Coated Polymeric Molds for Programmable, Hierarchical Patterning

Adv. Funct. Mater., vol. 27, issue 38

Zhao, Zhi; Cao, Yang; Cai, Yangjun; Yang, Jian; He, Ximin; Nordlander, Peter; Cremer, Paul S. (2017)
Oblique Colloidal Lithography for the Fabrication of Nonconcentric Features

ACS Nano, vol. 11, issue 7, pp 6594 - 6604

Sepideh Khodaparast; François Boulogne; Christophe Poulard; Howard A. Stone (2017)
Water-Based Peeling of Thin Hydrophobic Films

Phys. Rev. Lett., vol. 119, issue 15

Basutkar, Monali N.; Samant, Saumil; Strzalka, Joseph; Yager, Kevin G.; Singh, Gurpreet; Karim, Alamgir (2017)
Through-Thickness Vertically Ordered Lamellar Block Copolymer Thin Films on Unmodified Quartz with Cold Zone Annealing

Nano Lett., vol. 17, issue 12, pp 7814 - 7823

Vendamme, Richard; Eevers, Walter (2017)
Sticky Degradable Bioelastomers

Chem. Mater., vol. 29, issue 12, pp 5353 - 5363

Jeon, Hwan-Jin; Kim, Ju Young; Jung, Woo-Bin; Jeong, Hyeon-Su; Kim, Yun Ho; Shin, Dong Ok; Jeong, Seong-Jun; Shin, Jonghwa; Kim, Sang Ouk; Jung, Hee-Tae (2016)
Complex High-Aspect-Ratio Metal Nanostructures by Secondary Sputtering Combined with Block Copolymer Self-Assembly

Adv. Mater., vol. 28, issue 38, pp 8439 - 8445

Xiaoli Zheng; Zhanhua Wei; Haining Chen; Qianpeng Zhang; Hexiang He; Shuang Xiao; Zhiyong Fan; Kam Sing Wong; Shihe Yang (2016)
Designing nanobowl arrays of mesoporous TiO2 as an alternative electron transporting layer for carbon cathode-based perovskite solar cells

Nanoscale, vol. 8, issue 12, pp 6393 - 6402

Choi, Young Joo; Kim, Ju Young; Kim, Ji Eun; Mun, Jeong Ho; Cha, Seung Keun; Kim, Sang Ouk (2016)
Hierarchical Directed Self-Assembly of Diblock Copolymers for Modified Pattern Symmetry

Adv. Funct. Mater., vol. 26, issue 35, pp 6462 - 6470

Tao Li; Zhongli Wang; Lars Schulte; Sokol Ndoni (2016)
Substrate tolerant direct block copolymer nanolithography

Nanoscale, vol. 8, issue 1, pp 136 - 140

Blachut, Gregory; Sirard, Stephen M.; Maher, Michael J.; Asano, Yusuke; Someya, Yasunobu; Lane, Austin P.; Durand, William J.; Bates, Christopher M.; Dinhobl, Andrew M.; Gronheid, Roel; Hymes, Diane; Ellison, Christopher J.; Willson, C. Grant (2016)
A Hybrid Chemo-/Grapho-Epitaxial Alignment Strategy for Defect Reduction in Sub-10 nm Directed Self-Assembly of Silicon-Containing Block Copolymers

Chem. Mater., vol. 28, issue 24, pp 8951 - 8961

Kilho Yu; Byoungwook Park; Geunjin Kim; Chang-Hyun Kim; Sungjun Park; Jehan Kim; Suhyun Jung; Soyeong Jeong; Sooncheol Kwon; Hongkyu Kang; Junghwan Kim; Myung-Han Yoon; Kwanghee Lee (2016)
Optically transparent semiconducting polymer nanonetwork for flexible and transparent electronics

Proc. Natl. Acad. Sci. USA, vol. 113, issue 50, pp 14261 - 14266

Mukai, Koji; Hara, Mitsuo; Nagano, Shusaku; Seki, Takahiro (2016)
High-Density Liquid-Crystalline Polymer Brushes Formed by Surface Segregation and Self-Assembly

Angew. Chem., Int. Ed., vol. 55, issue 45, pp 14028 - 14032

Ju Young Kim; Hyowook Kim; Bong Hoon Kim; Taeyong Chang; Joonwon Lim; Hyeong Min Jin; Jeong Ho Mun; Young Joo Choi; Kyungjae Chung; Jonghwa Shin; Shanhui Fan; Sang Ouk Kim (2016)
Highly tunable refractive index visible-light metasurface from block copolymer self-assembly

Nature Commun., vol. 7

Diederichsen, Kyle M.; Brow, Ryan R.; Stoykovich, Mark P. (2015)
Percolating Transport and the Conductive Scaling Relationship in Lamellar Block Copolymers under Confinement

ACS Nano, vol. 9, issue 3, pp 2465 - 2476

Bal, Jayanta Kumar; Beuvier, Thomas; Unni, Aparna Beena; Chavez Panduro, Elvia Anabela; Vignaud, Guillaume; Delorme, Nicolas; Chebil, Mohamed Souheib; Grohens, Yves; Gibaud, Alain (2015)
Stability of Polymer Ultrathin Films (<7 nm) Made by a Top-Down Approach

ACS Nano, vol. 9, issue 8, pp 8184 - 8193

Cai, Xiao-Jing; Yuan, Hao-Miao; Blencowe, Anton; Qiao, Greg G.; Genzer, Jan; Spontak, Richard J. (2015)
Film-Stabilizing Attributes of Polymeric Core-Shell Nanoparticles

ACS Nano, vol. 9, issue 8, pp 7940 - 7949


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