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epitaxial film of cerium-doped yttrium aluminum perovskite

Based on

1 Articles
2013 Most recent source

Composition

Image only illustrates the order and placement of components as described in literature.

1

strontium dioxido(oxo)titanium

strontium titanium trioxide strontium titanium oxide strontium metatitanate strontium titanate STO
Type Single Compound
Formula SrTiO3
Role layer
2

lanthanum-aluminium mixed oxide

aluminium lanthanum oxide lanthanum aluminium oxide lanthanum aluminate crystalline LaAlO3 La-Al mixed oxide c-LAO LAO
Type Single Compound
Formula LaAlO3
Role layer
3

cerium-doped yttrium aluminum perovskite

YAlO3:Ce YAP:Ce
Type Complex Compound
Formula
Role layer

Properties

General physical and chemical properties

Property Value Nanomaterial Variant Source
acceptor emission rate

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Applications

Area Application Nanomaterial Variant Source
analysis methods

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Characterization

Method Nanomaterial Variant Source
atomic force microscopy

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Preparation

Method 1

Type: Physical formation
Source:
Starting materials
  1. zuvRXN2
  2. F3Gtl5jAo3UB
  3. DIlj787ABLqENFur34cpyaN4
Product

epitaxial film of cerium-doped yttrium aluminum perovskite

Thickness: 1.56 nm

Thickness: 20 nm

Thickness: 7 nm

Medium: none

Support: silicon

Method 2

Type: Physical formation
Source:
Starting materials
  1. wpLqDpG
  2. zfj6VP9Qzi8u
  3. aBcrG5A7xAzRytxeV1Q7f6AX
Product

epitaxial film of cerium-doped yttrium aluminum perovskite

Thickness: 1.56 nm

Thickness: 17 nm

Thickness: 20 nm

Medium: none

Support: silicon

Method 3

Type: Physical formation
Source:
Starting materials
  1. dsj0kel
  2. 7f1s6xcifCaD
  3. T2tcAo8LmmIg0WbvmLMePPS2
Product

epitaxial film of cerium-doped yttrium aluminum perovskite

Thickness: 1.56 nm

Thickness: 20 nm

Thickness: 4 - 63 nm

Medium: none

Support: silicon

Method 4

Type: Physical formation
Source:
Starting materials
  1. moBzn66
  2. 6G5naoy6Wzsm
  3. wIsPglYnO3kSUUxhMvzzfORf
Product

epitaxial film of cerium-doped yttrium aluminum perovskite

Thickness: 1.56 nm

Thickness: 20 nm

Thickness: ~ 23 nm

Medium: none

Support: silicon

Method 5

Type: Physical formation
Source:
Starting materials
  1. CWVc23P
  2. pLxoHmA4DHKf
  3. uNL5WR6OASyEvQs1mY1CeOxc
Product

epitaxial film of cerium-doped yttrium aluminum perovskite

Thickness: 1.56 nm

Thickness: 20 nm

Thickness: ~ 6.5 nm

Medium: none

Support: silicon

References

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