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epitaxial film of cerium-doped yttrium aluminum perovskite

Based on

1 Articles
2013 Most recent source

Composition

Image only illustrates the order and placement of components as described in literature.

1

strontium dioxido(oxo)titanium

strontium titanium trioxide strontium titanium oxide strontium metatitanate strontium titanate STO
Type Single Compound
Formula SrTiO3
Role layer
2

lanthanum-aluminium mixed oxide

lanthanum aluminium oxide aluminium lanthanum oxide lanthanum aluminate crystalline LaAlO3 La-Al mixed oxide c-LAO LAO
Type Single Compound
Formula LaAlO3
Role layer
3

cerium-doped yttrium aluminum perovskite

YAlO3:Ce YAP:Ce
Type Complex Compound
Formula
Role layer

Properties

General physical and chemical properties

Property Value Nanomaterial Variant Source
acceptor emission rate

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Applications

Area Application Nanomaterial Variant Source
analysis methods

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Characterization

Method Nanomaterial Variant Source
atomic force microscopy

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Preparation

Method 1

Type: Physical formation
Source:
Starting materials
  1. XMm84Ba
  2. YDa8WROOAR6G
  3. 1xERq1FzyYn8FuzjKIVDDUg5
Product

epitaxial film of cerium-doped yttrium aluminum perovskite

Thickness: 1.56 nm

Thickness: 18 nm

Thickness: 20 nm

Medium: none

Support: silicon

Method 2

Type: Physical formation
Source:
Starting materials
  1. ckJzLDG
  2. CemXbx8tlrg7
  3. F6U4IChXCWlalwkf5SLhQp9u
Product

epitaxial film of cerium-doped yttrium aluminum perovskite

Thickness: 1.56 nm

Thickness: 20 nm

Thickness: ~ 23 nm

Medium: none

Support: silicon

Method 3

Type: Physical formation
Source:
Starting materials
  1. WxiwksJ
  2. 6L2eXMY23ryw
  3. PoFeT9GyzMAjhlWVi0HWN38m
Product

epitaxial film of cerium-doped yttrium aluminum perovskite

Thickness: 1.56 nm

Thickness: 20 nm

Thickness: ~ 21 nm

Medium: none

Support: silicon

Method 4

Type: Physical formation
Source:
Starting materials
  1. ye33enM
  2. GnNFbm6A6G1O
  3. NoVferkop9twos8FXNAx5jI8
Product

epitaxial film of cerium-doped yttrium aluminum perovskite

Thickness: 1.56 nm

Thickness: 20 nm

Thickness: 63 nm

Medium: none

Support: silicon

Method 5

Type: Physical formation
Source:
  1. SKYY1fJH2gGj7a6qcs46GY8HY44QPAPmYlcivbG4FEL5Yc
Product

epitaxial film of cerium-doped yttrium aluminum perovskite

Thickness: 1.56 nm

Thickness: 15 - 20 nm

Thickness: 20 nm

Medium: none

Support: silicon

References

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