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epitaxial film of cerium-doped yttrium aluminum perovskite

Based on

1 Articles
2013 Most recent source

Composition

Image only illustrates the order and placement of components as described in literature.

1

strontium dioxido(oxo)titanium

strontium titanium trioxide strontium titanium oxide strontium metatitanate strontium titanate STO
Type Single Compound
Formula SrTiO3
Role layer
2

lanthanum-aluminium mixed oxide

lanthanum aluminium oxide aluminium lanthanum oxide lanthanum aluminate crystalline LaAlO3 La-Al mixed oxide c-LAO LAO
Type Single Compound
Formula LaAlO3
Role layer
3

cerium-doped yttrium aluminum perovskite

YAlO3:Ce YAP:Ce
Type Complex Compound
Formula
Role layer

Properties

General physical and chemical properties

Property Value Nanomaterial Variant Source
acceptor emission rate

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Applications

Area Application Nanomaterial Variant Source
analysis methods

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Characterization

Method Nanomaterial Variant Source
atomic force microscopy

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Preparation

Method 1

Type: Physical formation
Source:
Starting materials
  1. 4bw8tmX
  2. L4ObFaXMgl5w
  3. IVa2KdpQ2Ft4aliNl3TyDiMi
Product

epitaxial film of cerium-doped yttrium aluminum perovskite

Thickness: 1.56 nm

Thickness: 18 nm

Thickness: 20 nm

Medium: none

Support: silicon

Method 2

Type: Physical formation
Source:
Starting materials
  1. sgchiOY
  2. ijFkaKZa28rE
  3. PoJawbSVwFWTCUCr5S4wSluG
Product

epitaxial film of cerium-doped yttrium aluminum perovskite

Thickness: 1.56 nm

Thickness: 20 nm

Thickness: ~ 23 nm

Medium: none

Support: silicon

Method 3

Type: Physical formation
Source:
Starting materials
  1. BHTRLg6
  2. DvfBcWsmFJWx
  3. 7ybeBiq4KZtN2yu1HUNlpu0h
Product

epitaxial film of cerium-doped yttrium aluminum perovskite

Thickness: 1.56 nm

Thickness: 20 nm

Thickness: ~ 21 nm

Medium: none

Support: silicon

Method 4

Type: Physical formation
Source:
Starting materials
  1. sj3Ehmr
  2. CI8ETwSwRmlq
  3. vvueugvqruHNZGwl5BUBLDyo
Product

epitaxial film of cerium-doped yttrium aluminum perovskite

Thickness: 1.56 nm

Thickness: 20 nm

Thickness: 63 nm

Medium: none

Support: silicon

Method 5

Type: Physical formation
Source:
  1. Q3a6lCVUm5NxIUax4VeI2tI1tuo0sOOKdFZss9n4kO0u9b
Product

epitaxial film of cerium-doped yttrium aluminum perovskite

Thickness: 1.56 nm

Thickness: 15 - 20 nm

Thickness: 20 nm

Medium: none

Support: silicon

References

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