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PEDOT:PSS film

Based on

3 Articles
2016 Most recent source

Composition

Image only illustrates the order and placement of components as described in literature.

1

poly(3,4-ethylenedioxythiophene):poly(styrenesulfonate)

PEDOT:PSS
Type Complex Compound
Formula
Role raw materials

Properties

General physical and chemical properties

Property Value Nanomaterial Variant Source
average adhesive strength

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Applications

Area Application Nanomaterial Variant Source
electronics

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Characterization

Method Nanomaterial Variant Source
atomic force microscopy

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Biological effects

Preparation

Method 1

Type: Chemical synthesis
Source:
Starting materials
  • nanostructured silicon
  • γ-(2,3-epoxypropoxy)propyltrimethoxysilane
  • poly(3,4-ethylenedioxythiophene):poly(styrenesulfonate)
  1. tpsjtKLzuBVjDh2LRn
  2. RSJh39
Product

PEDOT:PSS film

Thickness: ~ 60 - 120 nm

Medium: none

Support: GOPS-modified nanostructured silicon

Method 2

Type: Chemical synthesis
Source:
Starting materials
  • poly(3,4-ethylenedioxythiophene):poly(styrenesulfonate)
  1. fs1MR25ABjJ
Product

PEDOT:PSS film

Thickness: ~ 50 nm

Medium: none

Support: tin-doped indium oxide

Method 3

Type: Physical formation
Source:
Starting materials
  • poly(styrenesulfonate)
  • poly(3,4-ethylenedioxythiophene)
  1. Rla7fxuVRmFWHEsp
  2. m07sGDiQbfuDQqejAmkmHXwOMX5svVFX
Product

PEDOT:PSS film

Roughness: 1.74 nm

Thickness: 154 nm

Medium/Support: none

Method 4

Type: Physical formation
Source:
Starting materials
  • poly(styrenesulfonate)
  • poly(3,4-ethylenedioxythiophene)
  1. RQ5j6IIZJi9aTacW
  2. w88JP6TAHN1RKYmj
Product

PEDOT:PSS film

Grain size: ~ 70 - 100 nm

Roughness: 1.17 nm

Thickness: 159 nm

Medium/Support: none

Method 5

Type: Physical formation
Source:
Starting materials
  • poly(styrenesulfonate)
  • poly(3,4-ethylenedioxythiophene)
  1. XbdKoOWRsqQgPb5P
Product

PEDOT:PSS film

Grain size: ~ 70 - 100 nm

Roughness: 0.98 nm

Thickness: 164 nm

Medium/Support: none

References

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