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poly[2,5-(2-octyldodecyl)-3,6-diketopyrrolopyrrole-alt-5,5-(2,5-di(thien-2-y)-thieno[3,2-b]thiophene)] film/nanogrooved octadecyltrichlorosilane-treated SiO2/highly doped n-type Si

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3 Articles
2017 Most recent source

Composition

Image only illustrates the order and placement of components as described in literature.

1

poly[2,5-(2-octyldodecyl)-3,6-diketopyrrolopyrrole-alt-5,5-(2,5-di(thien-2-y)thieno[3,2-b]thiophene)]

poly[2,5-(2-octyldodecyl)-3,6-diketopyrrolopyrrole-alt-5,5-(2,5-di(thien-2-y)thieno[3,2-b]thiophene)] DPPT-TT DPPDTT
Type Polymer
Formula
Role raw materials

Properties

General physical and chemical properties

Property Value Nanomaterial Variant Source
crack onset strain

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Applications

Area Application Nanomaterial Variant Source
electronics

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Characterization

Method Nanomaterial Variant Source
atomic force microscopy

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Biological effects

Preparation

Method 1

Type: Physical formation
Source:
Starting materials
  • poly(2,5-bis(2-octyldodecyl)- 3,6-di(thiophen-2-yl)diketopyrrolo[3,4-c]pyrrole-1,4-dione-alt-thieno[3,2-b]thiophen)
  1. oCdN98sq6SZHT
Product

poly[2,5-(2-octyldodecyl)-3,6-diketopyrrolopyrrole-alt-5,5-(2,5-di(thien-2-y)-thieno[3,2-b]thiophene)] film/nanogrooved octadecyltrichlorosilane-treated SiO2/highly doped n-type Si

Thickness: ~ 35 nm

Medium/Support: none

Method 2

Type: Physical formation
Source:
Starting materials
  • poly[2,5-(2-octyldodecyl)-3,6-diketopyrrolopyrrole-alt-5,5-(2,5-di(thien-2-y)thieno[3,2-b]thiophene)]
  1. vmTZ8ZVCLuPZl5peS4e9icVxMAfs
  2. sFvrd
Product

poly[2,5-(2-octyldodecyl)-3,6-diketopyrrolopyrrole-alt-5,5-(2,5-di(thien-2-y)-thieno[3,2-b]thiophene)] film/nanogrooved octadecyltrichlorosilane-treated SiO2/highly doped n-type Si

Crystalline correlation length: 14.73 nm

RMS roughness: 2.09 nm

Thickness: ~ 60 - ~ 80 nm

Medium/Support: none

Method 3

Type: Chemical synthesis
Source:
Starting materials
  • SiO2/n-type Si
Product

poly[2,5-(2-octyldodecyl)-3,6-diketopyrrolopyrrole-alt-5,5-(2,5-di(thien-2-y)-thieno[3,2-b]thiophene)] film/nanogrooved octadecyltrichlorosilane-treated SiO2/highly doped n-type Si

Crystalline correlation length: 17.09 nm

RMS roughness: 4.34 nm

Thickness: ~ 60 - ~ 80 nm

Medium: none

Support: nanogrooved octadecyltrichlorosilane-treated SiO2/highly doped n-type Si

Method 4

Type: Physical formation
Source:
Starting materials
  • poly[2,5-(2-octyldodecyl)-3,6-diketopyrrolopyrrole-alt-5,5-(2,5-di(thien-2-y)thieno[3,2-b]thiophene)]
  1. 4UFZmtxG6du86JiLDL9pTvqQwRHi
  2. Ot8ao
  3. oCGEwth5SKPG5OaUJl
  4. sZ1dXn5PqHgyMfGxffUCps72ig3
Product

poly[2,5-(2-octyldodecyl)-3,6-diketopyrrolopyrrole-alt-5,5-(2,5-di(thien-2-y)-thieno[3,2-b]thiophene)] film/nanogrooved octadecyltrichlorosilane-treated SiO2/highly doped n-type Si

Crystalline correlation length: 17.09 nm

RMS roughness: 3.23 nm

Thickness: ~ 60 - ~ 80 nm

Medium/Support: none

Method 5

Type: Chemical synthesis
Source:
Starting materials
  • SiO2/n-type Si
Product

poly[2,5-(2-octyldodecyl)-3,6-diketopyrrolopyrrole-alt-5,5-(2,5-di(thien-2-y)-thieno[3,2-b]thiophene)] film/nanogrooved octadecyltrichlorosilane-treated SiO2/highly doped n-type Si

Crystalline correlation length: 14.73 nm

RMS roughness: 3.70 nm

Thickness: ~ 60 - ~ 80 nm

Medium: none

Support: nanogrooved octadecyltrichlorosilane-treated SiO2/highly doped n-type Si

References

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