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poly[2,5-(2-octyldodecyl)-3,6-diketopyrrolopyrrole-alt-5,5-(2,5-di(thien-2-y)-thieno[3,2-b]thiophene)] film/nanogrooved octadecyltrichlorosilane-treated SiO2/highly doped n-type Si

Based on

3 Articles
2017 Most recent source

Composition

Image only illustrates the order and placement of components as described in literature.

1

poly[2,5-(2-octyldodecyl)-3,6-diketopyrrolopyrrole-alt-5,5-(2,5-di(thien-2-y)thieno[3,2-b]thiophene)]

DPPDTT
Type Polymer
Formula
Role raw materials

Properties

General physical and chemical properties

Property Value Nanomaterial Variant Source
crack onset strain

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Applications

Area Application Nanomaterial Variant Source
electronics

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Characterization

Method Nanomaterial Variant Source
atomic force microscopy

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Biological effects

Preparation

Method 1

Type: Physical formation
Source:
Starting materials
  • poly[2,5-(2-octyldodecyl)-3,6-diketopyrrolopyrrole-alt-5,5-(2,5-di(thien-2-y)thieno[3,2-b]thiophene)]
  1. UgBVpOI627kYXR8fj5HcZwfCHXby
  2. uBt5P
Product

poly[2,5-(2-octyldodecyl)-3,6-diketopyrrolopyrrole-alt-5,5-(2,5-di(thien-2-y)-thieno[3,2-b]thiophene)] film/nanogrooved octadecyltrichlorosilane-treated SiO2/highly doped n-type Si

Crystalline correlation length: 14.73 nm

RMS roughness: 2.09 nm

Thickness: ~ 60 - ~ 80 nm

Medium/Support: none

Method 2

Type: Chemical synthesis
Source:
Starting materials
  • SiO2/n-type Si
Product

poly[2,5-(2-octyldodecyl)-3,6-diketopyrrolopyrrole-alt-5,5-(2,5-di(thien-2-y)-thieno[3,2-b]thiophene)] film/nanogrooved octadecyltrichlorosilane-treated SiO2/highly doped n-type Si

Crystalline correlation length: 14.73 nm

RMS roughness: 3.70 nm

Thickness: ~ 60 - ~ 80 nm

Medium: none

Support: nanogrooved octadecyltrichlorosilane-treated SiO2/highly doped n-type Si

Method 3

Type: Chemical synthesis
Source:
Starting materials
  • SiO2/n-type Si
Product

poly[2,5-(2-octyldodecyl)-3,6-diketopyrrolopyrrole-alt-5,5-(2,5-di(thien-2-y)-thieno[3,2-b]thiophene)] film/nanogrooved octadecyltrichlorosilane-treated SiO2/highly doped n-type Si

Crystalline correlation length: 17.09 nm

RMS roughness: 4.34 nm

Thickness: ~ 60 - ~ 80 nm

Medium: none

Support: nanogrooved octadecyltrichlorosilane-treated SiO2/highly doped n-type Si

Method 4

Type: Physical formation
Source:
Starting materials
  • poly[2,5-(2-octyldodecyl)-3,6-diketopyrrolopyrrole-alt-5,5-(2,5-di(thien-2-y)thieno[3,2-b]thiophene)]
  1. JT79TfmYjIM6AaYHogWR3zxPPYpI
  2. iQkmZ
  3. gXp3lhmxDl3MzWXl5E
  4. bVXIa9Nv7JyyqZq3sm1AKkcBAuX
Product

poly[2,5-(2-octyldodecyl)-3,6-diketopyrrolopyrrole-alt-5,5-(2,5-di(thien-2-y)-thieno[3,2-b]thiophene)] film/nanogrooved octadecyltrichlorosilane-treated SiO2/highly doped n-type Si

Crystalline correlation length: 17.09 nm

RMS roughness: 3.23 nm

Thickness: ~ 60 - ~ 80 nm

Medium/Support: none

Method 5

Type: Physical formation
Source:
Starting materials
  • DPPT-TT
  1. midcpM83voPRcCIbnSYJLATL
  2. Ugg6MTmL9Gt
  3. AhGBzGOf
Product

poly[2,5-(2-octyldodecyl)-3,6-diketopyrrolopyrrole-alt-5,5-(2,5-di(thien-2-y)-thieno[3,2-b]thiophene)] film/nanogrooved octadecyltrichlorosilane-treated SiO2/highly doped n-type Si

Thickness: 7.5 nm

Medium: none

Support: soda-lime-silica glass

References

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