Access easily searchable nanoscience data, synthesis methods and literature
Image only illustrates the order and placement of components as described in literature.
lanthanum strontium manganese oxide-polycrystalline yttria stabilized zirconia film on silicon wafer
Grain boundaries thickness: ~ 1 nm
Grain size: 9 - 23 nm
RMS roughness: 0.9 nm
Thickness: 100 nm
Thickness: 300 nm