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epitaxial film of cerium-doped yttrium aluminum perovskite

Based on

1 Articles
2013 Most recent source

Composition

Image only illustrates the order and placement of components as described in literature.

1

strontium dioxido(oxo)titanium

strontium titanium trioxide strontium titanium oxide strontium metatitanate strontium titanate STO
Type Single Compound
Formula SrTiO3
Role layer
2

lanthanum-aluminium mixed oxide

aluminium lanthanum oxide lanthanum aluminium oxide lanthanum aluminate crystalline LaAlO3 La-Al mixed oxide c-LAO LAO
Type Single Compound
Formula LaAlO3
Role layer
3

cerium-doped yttrium aluminum perovskite

YAlO3:Ce YAP:Ce
Type Complex Compound
Formula
Role layer

Properties

General physical and chemical properties

Property Value Nanomaterial Variant Source
acceptor emission rate

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Applications

Area Application Nanomaterial Variant Source
analysis methods

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Characterization

Method Nanomaterial Variant Source
atomic force microscopy

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Biological effects

Preparation

Method 1

Type: Physical formation
Source:
Starting materials
  1. cGGJ2UK
  2. 4iARHBzbg3GA
  3. wKq0WoFg2oUAPBicasaCRcKA
Product

epitaxial film of cerium-doped yttrium aluminum perovskite

Thickness: 1.56 nm

Thickness: 20 nm

Thickness: 7 nm

Medium: none

Support: silicon

Method 2

Type: Physical formation
Source:
Starting materials
  1. Q40eVn7
  2. d79w5VyHydA0
  3. b1BA2HlXiWiy3Sulj3GXcjK6
Product

epitaxial film of cerium-doped yttrium aluminum perovskite

Thickness: 1.56 nm

Thickness: 17 nm

Thickness: 20 nm

Medium: none

Support: silicon

Method 3

Type: Physical formation
Source:
Starting materials
  1. xUcnrlo
  2. ty72OBQGwihh
  3. A1n8B1jXIZ8YTvuLn5kxQOSO
Product

epitaxial film of cerium-doped yttrium aluminum perovskite

Thickness: 1.56 nm

Thickness: 20 nm

Thickness: 4 - 63 nm

Medium: none

Support: silicon

Method 4

Type: Physical formation
Source:
Starting materials
  1. EQ3v489
  2. jyTD5b4X48Me
  3. FKj9YxErVcnxwtFEXzBNBpX4
Product

epitaxial film of cerium-doped yttrium aluminum perovskite

Thickness: 1.56 nm

Thickness: 20 nm

Thickness: ~ 23 nm

Medium: none

Support: silicon

Method 5

Type: Physical formation
Source:
Starting materials
  1. FaQaEGa
  2. pZybykHzG5Dx
  3. k1LQKooOxLILjhhoF7Ao0SUw
Product

epitaxial film of cerium-doped yttrium aluminum perovskite

Thickness: 1.56 nm

Thickness: 20 nm

Thickness: ~ 6.5 nm

Medium: none

Support: silicon

References

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