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conductive atomic force microscopy (C-AFM) tip with Pd filament

Based on

1 Articles
2011 Most recent source

Composition

1

conductive atomic force microscopy (C-AFM) tip

Type
Formula
Role
2

palladium

Type
Formula Pd
Role

Properties

General physical and chemical properties

Property Value Nanomaterial Variant Source
conductance

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Applications

Area Application Nanomaterial Variant Source
tools/devices

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Characterization

Biological effects

Preparation

Method 1

Type: Physical formation
Source:
Starting materials
  1. mFKtu7nfpQbM4HfAmrKR49ua7KvvBQAGHohLtBHamjn8Q3fYpViMif8l3NeyIQ436AHNGlGYeQ1SL7QOMx4fcEQEHnpDRC82aAaQ
  2. PIsF
Product

conductive atomic force microscopy (C-AFM) tip with Pd filament

Size: not specified

Medium/Support: none

References

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